Applications of Dispersive Optical Spectroscopy Systems

Author(s): Wilfried Neumann

Published: 2015

PDF ISBN: 9781628413731 | Print ISBN: 9781628413724

DESCRIPTION

Bridging the gap between a theoretical background in applied spectroscopy systems and practical recommendations, Applications of Dispersive Optical Spectroscopy Systems addresses the requirements, recommended configurations, and the justification and verification of systems for various applications. Topics include the selection and combination of components to fulfill requirements, as well as methods to justify the functionality. This book is suitable for students, engineers, and scientists looking for a concise text that provides background knowledge, perspective, and technical details for system designers and an easy-to-read compendium for specialists.

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Front Matter

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CHAPTER 1.

Transmission, Absorption, and Reflection Measurements

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1.0 Introduction
1.0.1 Principles
1.0.2 Absorption measurements
1.0.3 Reflection measurement
1.1 Techniques for Static Absorption Measurements
1.1.1 Technical realization of an optimal spectrophotometer for absorption and reflection
1.1.2 Detection range at the wavelength and signal scale
1.1.3 Data-acquisition methods
1.1.4 Light path and spectral disturbance
1.1.5 The optimal spectrophotometer
1.1.6 A standard high-performance spectrophotometer
1.1.7 Spectrophotometer with parallel wavelength detection
1.1.8 Detection range on the wavelength and signal scale with parallel wavelength detection, and single-beam spectrophotometers
1.1.9 Proposal for a universal sample chamber for dual-beam spectrophotometry
1.1.10 Calibration and the definition of stray light
1.2 Dynamic Absorption Measurements
1.2.1 Typical experiments
1.3 Special Absorption Techniques
1.3.1 Atomic absorption spectroscopy
1.3.2 Polarized transmission: CD and ORD
1.3.3 Spectrometers for scattered transmission
1.3.4 Photoacoustic (optoacoustic) spectroscopy
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CHAPTER 2.

Ellipsometry

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2.0 Introduction
2.1 Elements of Spectroscopic Ellipsometers
2.1.1 The Stokes parameters
2.1.2 Research-grade spectroscopic ellipsometers
2.2 Applications of Spectroscopic Ellipsometry
2.2.1 Building blocks of SE for research, material analysis, and product definition
2.3 Basic Equations of RPSE Parameters Presented by Software and in Literature
2.4 Comparison between SE and Single-Wavelength Ellipsometry
2.5 Production-Oriented SE
2.5.1 SE with parallel detection
2.5.2 in situ SE
2.5.3 SE with a reduced spot size
2.6 Data Origin and Reduction
2.7 Limits of the SE Method
2.7.1 Measurement of P, the degree of polarization
2.8 SE Examples
2.9 Extensions of the Instrumentation for Spectroscopic Ellipsometry
2.9.1 SE system for the deep UV
2.9.2 SE system for the IR range
2.10 Calibration of SE Systems
2.11 Photometric Applications by SE Systems
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CHAPTER 3.

Emission Spectroscopy

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3.0 Introduction
3.0.1 Instrumental technology for the acquisition of emission spectra
3.0.2 Typical emission spectra
3.0.3 Setup based on 2D Echelle spectrometers
3.0.4 Scanning (Echelle) spectrometers
3.1 Atomic Emission Spectroscopy
3.1.1 Scanning AES
3.1.2 Parallel-detecting AES
3.2 Cathodo luminescence spectroscopy
3.3 Spectroscopy at Inductively Coupled Plasma
3.3.1 ICP examples
3.4 Spark Optical Emission Spectroscopy
3.5 Laser Ablation
3.6 Plasma Etching
3.7 Solar and Stellar Emission
3.8 Emission Measurements at Explosions and Flames
References

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CHAPTER 4.

Luminescence

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4.0 Introduction
4.0.1 Parameters of luminescence measurements
4.0.2 Requirements of luminescence measurements
4.1 Setup of a Static Luminescence Spectrophotometer
4.1.1 Instrumental considerations
4.1.2 Light path and spectral disturbance
4.1.3 Details of a static photoluminescence spectrophotometer
4.1.4 Measurement methods of static luminescence spectroscopy
4.1.5 Summary of the requirements for a static luminescence spectrophotometer
4.1.6 Calibration, comparison of systems, and stray light tests
4.2 Dynamic Luminescence/Lifetime Measurements
4.2.1 Available instrumentation
4.2.2 Continuous methods
4.2.3 Methods using parallel wavelength detection
4.2.4 Pulsed excitation and streak camera detection
References

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CHAPTER 5.

Radiometry

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5.0 Introduction
5.1 Radiometric Parameters
5.1.1 Definition and measurement of the spectral radiant power
5.1.2 Measurement of the spectral irradiance E and the radiance L
5.1.3 Radiometry with parallel-detecting spectrographs
5.2 Radiometric Sample Illumination
5.2.1 General requirements, independent from the application
5.3 Analysis of Spectral and Power Spatial Distribution Provided by the System
5.3.1 Reference analysis by a single point detector
5.3.2 Analysis of spectral and power distribution over the illuminated field
5.4 Calibration of Radiometric Spectral Data
5.4.1 Description of a realized system and its calibration with a certified source, enabling calibrated source analysis
5.4.2 Calibration facilities
References

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CHAPTER 6.

Raman and Brillouin Spectroscopy

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6.0 Introduction to Scattering Spectroscopy
6.1 The Principle of Raman Spectroscopy Measurements
6.2 Requirements for a Raman Spectrometer
6.2.1 Spectrometer options
6.2.2 Summary of wavelength dependence
6.3 Beam Travel and Spectral Interferences
6.4 Exemplary Raman and Brillouin Spectra
6.5 Design or Selection of Raman Spectrometers
6.5.1 The wavelength of excitation
6.5.2 Applicable distance of Raman signals
6.6 Special Raman Methods
6.6.1 Raman versus fluorescence
6.6.2 NIR Raman
6.6.3 UV Raman
6.6.4 Raman microscopy
6.6.5 Resonance Raman (RR)
6.6.6 Surface-enhanced Raman scattering (SERS)
6.6.7 Coherent anti-Stokes Raman spectroscopy (CARS)
References

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CHAPTER 7.

Spectrometry of Laser Light

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7.0 Introduction
7.0.1 Near field and far field
7.0.2 Considerations
7.1 Measurements in the UV–Vis–NIR Range
7.1.1 Spectral analysis of lasers with single or rather distant lines, and small beam cross section (like He-Ne, argon ion, or other gas lasers)
7.2 Fabry–Pe´ rot Interferometer
7.3 Spectral Measurements of Large Laser Images
7.4 Imaging Analysis
7.5 Hyperspectral Analysis
7.6 Commercial Analysis Systems
References

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Back Matter

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Back Matter — Errata

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