PROCEEDINGS VOLUME 4301
PHOTONICS WEST 2001 - ELECTRONIC IMAGING | 20-26 JANUARY 2001
Machine Vision Applications in Industrial Inspection IX
Editor(s): Martin A. Hunt
Editor Affiliations +
PHOTONICS WEST 2001 - ELECTRONIC IMAGING
20-26 January 2001
San Jose, CA, United States
Industrial Inspection Systems
Yair Kipman, David Wolin, Kate Johnson
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420897
Ralf Langenbach, Alexander Ohl, Peter Scharf, Joerg Semmler
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420906
Poster Session
Fabrice Meriaudeau, Akir Chaouki
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420916
Industrial Inspection Systems
Radovan D. Stojanovic, George D. Papadopoulos, Panagiotis Mitropoulos, Ioannis Konstantinidis
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420921
Richard D. R. Macdonald
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420922
Martin Kampel, Christian Liska, Srdan Tosovic
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420923
Segmentation and Defect Detection
Selin Baskan, M. Mete Bulut, Volkan Atalay
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420924
Wei-Ching Tham, Sandra Isobel Woolley, Don Anderson
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420898
Sophie Kohler, Pierre Geveaux, Johel Miteran
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420899
Color and Appearance
Larry J. Harpring, Martin J. Pechersky
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420900
Filip Feyaerts, Peter Vanroose, Rik Fransens, Luc J. Van Gool
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420901
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420902
Lucia Ballerini, Anders Hogberg, Kerstin Lundstrom, Gunilla Borgefors
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420903
Process Measurement and Pattern Recognition
JennKwei Tyan, Ming Fang
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420904
Hoseong Kim, Jinhwan Ko
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420905
Takao Tsuda, Daiichiro Kato, Akio Ishikawa, Seiki Inoue
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420907
Shang-Hong Lai, Ming Fang
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420908
Jiuhuai Lu
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420909
Satish Mishra, Damayanti C. Gharpure
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420910
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420911
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420912
Illumination and Surface Characteristics
Ralph Seulin, Fred Merienne, Patrick Gorria
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420913
Daniel F. Garcia, Ruben Usamentiaga, Ignacio Marin, Juan A. Gonzalez, Nicolas de Abajo
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420914
Leopoldo Altamirano-Robles, Miguel Arias-Estrada, Aurelio Lopez-Lopez, Rafael Lemuz-Lopez
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420915
Poster Session
Rodrigo Montufar-Chaveznava, Domingo Guinea, Maria C. Garcia-Alegre, Victor M. Preciado
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420917
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420918
Michael Reiter, Thomas Melzer
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420919
Victor M. Preciado, Domingo Guinea, Rodrigo Montufar-Chaveznava, Jose Vicente
Proceedings Volume Machine Vision Applications in Industrial Inspection IX, (2001) https://doi.org/10.1117/12.420920
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