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7 March 2022 Wide-field Raman microscopy with STORM post-processing: a powerful tool to increase spatial resolution and acquisition speed in Raman imaging
Joachim Jelken, Leila Mazaheri, François Lagugné-Labarthet
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Proceedings Volume PC11944, Multiscale Imaging and Spectroscopy III; PC119440B (2022) https://doi.org/10.1117/12.2608984
Event: SPIE BiOS, 2022, San Francisco, California, United States
Abstract
Here, we report on the development of a wide field Raman microscope which significantly improves the speed of acquisition at selected spectral range with spatial resolution in the range of ~200 nm over large field of view. This is achieved by analyzing small fluctuations in a large time-series of Raman images with a stochastic optical reconstruction microscopy (STORM) protocol in order to localize the molecules. We demonstrate the potential of this microscope by analyzing distinct samples such of patterned Silicon, polystyrene microspheres on Silicon wafer and graphene on Silicon/Silicon dioxide substrate.
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Joachim Jelken, Leila Mazaheri, and François Lagugné-Labarthet "Wide-field Raman microscopy with STORM post-processing: a powerful tool to increase spatial resolution and acquisition speed in Raman imaging", Proc. SPIE PC11944, Multiscale Imaging and Spectroscopy III, PC119440B (7 March 2022); https://doi.org/10.1117/12.2608984
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KEYWORDS
Raman spectroscopy
Spatial resolution
Microscopy
Imaging spectroscopy
Silicon
Microscopes
Spectroscopy
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