Photophysical detection, identification and characterization of nanoparticles, quantum dots and single emitter
are essential to enhance the efficiency of preparation methods as well as their electronic and optical properties. We present a powerful combination of time-resolved photoluminescence microscopy with a spectrometer, which results in a valuable toolbox for researcher. This combination of microscopic (e.g., FLIM, PLIM or antibunching) and spectroscopic methods like wavelength dependent emission scanning enables a deeper understanding for the optimization of properties and efficiencies in practical applications.
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