Single-shot extended field-of-view imaging using pupil phase engineering

Kedar Khare; Ritika Malik

doi:10.1117/12.3008499

13 March 2024 Single-shot extended field-of-view imaging using pupil phase engineering

Kedar Khare, Ritika Malik

Proceedings Volume PC12848, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI; PC1284801 (2024) https://doi.org/10.1117/12.3008499
Event: SPIE BiOS, 2024, San Francisco, California, United States

Abstract

We demonstrate an extended FOV imaging concept which relies on exchanging the real and the Fourier spaces relative to the structured illumination microscopy (SIM). While SIM achieves Fourier space extension by structuring illumination in the real space, we show that effective detector area of an imaging system can be extended by structuring in the Fourier space. Structuring in Fourier space is achieved by a designer phase mask in the Fourier plane of the imaging system and the extended FOV can be obtained in single shot image record. A PSF design for extended FOV and corresponding experimental results will be described.

Conference Presentation

Citation Download Citation

Kedar Khare and Ritika Malik "Single-shot extended field-of-view imaging using pupil phase engineering", Proc. SPIE PC12848, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI, PC1284801 (13 March 2024); https://doi.org/10.1117/12.3008499

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