3D refractive index microscopy with multiple-scattering samples

Laura Waller

doi:10.1117/12.3000250

13 March 2024 3D refractive index microscopy with multiple-scattering samples

Laura Waller

Proceedings Volume PC12852, Quantitative Phase Imaging X; PC128520F (2024) https://doi.org/10.1117/12.3000250
Event: SPIE BiOS, 2024, San Francisco, California, United States

Abstract

This talk will describe new microscopy methods for imaging of thick scattering samples in both transmission and reflection mode. We use computational imaging techniques to measure 3D phase (refractive index) in samples that incur multiple scattering (e.g. embryos or whole organisms), by modeling the scattering and solving an inverse problem with machine-learning augmented inverse solvers.

Conference Presentation

Citation Download Citation

Laura Waller "3D refractive index microscopy with multiple-scattering samples", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC128520F (13 March 2024); https://doi.org/10.1117/12.3000250

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