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26 September 1978 Computational Methods For Optical Thin Films
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Proceedings Volume 0140, Optical Coatings: Applications and Utilization II; (1978) https://doi.org/10.1117/12.956264
Event: 1978 Technical Symposium East, 1978, Washington, D.C., United States
Abstract
This paper reviews the Smith Chart and the characteristic matrix for evaluating the reflectance of optical thin films. The methods are developed from fundamentals and brief examples are given. The use of an HP-67 programmable calculator to make computations based on these methods is also discussed.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gary W. DeBell "Computational Methods For Optical Thin Films", Proc. SPIE 0140, Optical Coatings: Applications and Utilization II, (26 September 1978); https://doi.org/10.1117/12.956264
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