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4 April 1979 Automatic Data Reduction Of Both Simple And Complex Interference Patterns
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Proceedings Volume 0171, Optical Components: Manufacture and Evaluation; (1979)
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States
This paper describes an automatic pattern processor which can be utilized for reducing both simple and complex interference patterns derived from high quality optical surfaces. The complex patterns may be produced either by optical interference phenomena or by contour patterns obtained from either holographic or Moire techniques. The rapid, accurate measurement and analysis of even simple interference patterns has heretofore been tedious and time consuming due to the unavailability of objective, affordable instrumentation. In practice, many interference patterns can have poor contrast, such as in some Moire or holographic tests; large fringe deviations, such as in aspheric testing; and high spatial frequency deviations, as with diamond turned surfaces. For these cases, the measurement problems become significantly more formidable.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Walter H. Augustyn "Automatic Data Reduction Of Both Simple And Complex Interference Patterns", Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979);

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