Paper
9 August 1979 Layered Synthetic Microstructures: Properties And Applications In X-Ray Astronomy
James H. Underwood, Troy W. Barbee Jr., Douglas C. Keith
Author Affiliations +
Proceedings Volume 0184, Space Optics Imaging X-Ray Optics Workshop; (1979) https://doi.org/10.1117/12.957441
Event: 1979 Huntsville Technical Symposium, 1979, Huntsville, United States
Abstract
Improvements in vacuum deposition technology have made it possible to produce structures in whichotwo materials are arranged in alternating layers of uniform thickness. These layers may be as thin as 5A. Such structures act as Bragg diffractors or "artificial crystals" for x-rays - alternatively they may be viewed as multilayer interference coatings. These devices have many potential applications in x-ray and euv astronomy. Through the use of a dynamical theory, we show how the properties of LSM's depend on the layer materials and thicknesses and how these properties may be "tailored" for specific applications. Laboratory results at various x-ray wavelengths are presented. Finally, specific x-ray astronomy applications in the areas of spectroscopy, imaging, polarimetry and laboratory calibration are discussed.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James H. Underwood, Troy W. Barbee Jr., and Douglas C. Keith "Layered Synthetic Microstructures: Properties And Applications In X-Ray Astronomy", Proc. SPIE 0184, Space Optics Imaging X-Ray Optics Workshop, (9 August 1979); https://doi.org/10.1117/12.957441
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Cited by 9 scholarly publications.
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KEYWORDS
Reflectivity

X-ray astronomy

X-rays

Crystals

Spectroscopy

Astronomy

Extreme ultraviolet

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