Translator Disclaimer
21 November 1980 Performance Verification Of An Automated Image Cataloging System
Author Affiliations +
Proceedings Volume 0264, Applications of Digital Image Processing to Astronomy; (1980)
Event: 1981 Los Angeles Technical Symposium, 1980, Los Angeles, United States
A system, FOCAS (Faint Object Classification and Analysis System), designed to automatically detect and catalog stellar and galactic images on photographic plates is described. FOCAS was designed and is used to find all objects brighter than a limiting magnitude (24th on nitrogen baked IIIaJ plates exposed for one hour on the KPNO 4m telescope) and classify each image as stellar (nonresolved) or galactic (resolved). An important task in the implementation of this system is to verify that it performs as designed and to establish its limitations. The following internal tests were made to establish confidence in the automated cataloging system. Processing and comparing objects from two plates of the same field yields information about object detection efficiency and classification consistency. Processing synthesized dim stellar images provides detection efficiency information. Classification of synthesized stellar and galactic images gives information regarding classification accuracy. Processing a uniformly fogged plate establishes the magnitude where emulsion irregularities begin being detected as images. Comparison of FOCAS results with deeper CCD and video camera images corroborates these internal tests.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. F. Jarvis and J. A. Tyson "Performance Verification Of An Automated Image Cataloging System", Proc. SPIE 0264, Applications of Digital Image Processing to Astronomy, (21 November 1980);


A Faint Galaxy Counting System
Proceedings of SPIE (November 21 1980)
Resolution Classifier
Proceedings of SPIE (November 16 1982)
Focas-Faint Object Classification And Analysis System
Proceedings of SPIE (May 03 1979)
CCD image enhancement techniques for high-noise devices
Proceedings of SPIE (October 24 2003)
Drift Scan Observations With A Charge-Coupled Device (CCD)
Proceedings of SPIE (November 16 1982)

Back to Top