Microprocessor-Based Charge-Coupled Device (CCD) Test Console

E. L. Deraniak; R. A. Bredthauer; E. M. Hicks; J. E. Vicars; R. A. Florence

doi:10.1117/12.959913

20 July 1981 Microprocessor-Based Charge-Coupled Device (CCD) Test Console

E. L. Deraniak, R. A. Bredthauer, E. M. Hicks, J. E. Vicars, R. A. Florence

Proceedings Volume 0267, Staring Infrared Focal Plane Technology; (1981) https://doi.org/10.1117/12.959913
Event: 1981 Los Angeles Technical Symposium, 1980, Los Angeles, United States

Abstract

The integration of a commercially available microprocessor system (Commodore PET 2001) to control test equipment used in CCD array testing is described. The system can be used to determine charge transfer efficiency and noise of a CCD array for preliminary evaluation. The system is interactively controlled by an operator who runs a BASIC program from the keyboard of the microprocessor. Data collection is done by the computer/interface to minimize operator errors. The system is implemented primarily for quick-look quantitative evaluation of arrays being mass produced by industry.

Citation Download Citation

E. L. Deraniak, R. A. Bredthauer, E. M. Hicks, J. E. Vicars, and R. A. Florence "Microprocessor-Based Charge-Coupled Device (CCD) Test Console", Proc. SPIE 0267, Staring Infrared Focal Plane Technology, (20 July 1981); https://doi.org/10.1117/12.959913

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