Subpicosecond Electrical Sampling

J. A. Valdmanis; G. Mourou; C. W. Gabel

doi:10.1117/12.966086

28 November 1983 Subpicosecond Electrical Sampling

J. A. Valdmanis, G. Mourou, C. W. Gabel

Proceedings Volume 0439, Picosecond Optoelectronics; (1983) https://doi.org/10.1117/12.966086
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

We report on the recent advances of an electrooptic sampling technique for the characterization of electrical transients that has now achieved a temporal resolution of .5 ps. Voltage sensitivity is on the order of 50 μV. The electrooptic material is used in a traveling wave geometry as well as in an electrodeless manner, where the electrooptic material probe the fringing field associated with the signal as it propagates along the transmission line.

Citation Download Citation

J. A. Valdmanis, G. Mourou, and C. W. Gabel "Subpicosecond Electrical Sampling", Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); https://doi.org/10.1117/12.966086

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