Determination Of Inherent Contrast Resolution In X-Ray Imaging Using Electron Density And Effective Atomic Number Differences

Frank A. DiBianca; Joan E Fetter; Marion D Barker

doi:10.1117/12.939310

15 June 1984 Determination Of Inherent Contrast Resolution In X-Ray Imaging Using Electron Density And Effective Atomic Number Differences

Frank A. DiBianca, Joan E Fetter, Marion D Barker

Author Affiliations +

Proceedings Volume 0454, Application of Optical Instrumentation in Medicine XII; (1984) https://doi.org/10.1117/12.939310
Event: Application of Optical Instrumentation in Medicine XII, 1984, San Diego, United States

Abstract

The problem of determining the inherent contrast resolution of an x-ray imaging device (CT or projection x-ray) has not thus far been satisfactorily solved. The contrast signal-to-noise ratio depends on the geometry and composition of the object being imaged, the x-ray beam spectrum and the detector spectral efficiency (signal) as well as a host of factors which contribute to the quantum and non-quantum statistical fluctuation in the image (noise). Because contrast depends on machine spectral factors as well as phantom atomic number differences, measurements made using any single low contrast phantom cannot yield the inherent contrast resolution but only the contrast resolution of the system for phantoms of that geometry and composition. We have overcome this problem by developing and using two phantoms to measure inherent contrast resolution: in one phantom the contrast-generating structures differ from the background material only in electron density, while in the second phantom the contrast is generated purely by a difference in effective atomic number of the materials. Measurements made using these phantoms allow the determination of the inherent contrast resolution of the device for objects of any composition. In this paper, descriptions of the construction and composition of the electron density and atomic number phantoms are given. Computer simulations and preliminary measurements of the inherent contrast resolution of clinical x-ray imaging systems are presented. From these, one can develop optimum methods of operating x-ray imaging devices.

Citation Download Citation

Frank A. DiBianca, Joan E Fetter, and Marion D Barker "Determination Of Inherent Contrast Resolution In X-Ray Imaging Using Electron Density And Effective Atomic Number Differences", Proc. SPIE 0454, Application of Optical Instrumentation in Medicine XII, (15 June 1984); https://doi.org/10.1117/12.939310

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

X-ray imaging

X-rays

Image resolution

Sensors

Signal detection

Imaging devices

Signal to noise ratio

Show All Keywords

Keywords/Phrases

Search In:

Publication Years