Paper
28 August 1984 Variable-Thickness Chest Filtration: The Effect Of High Atomic Number Filter Materials
Carl J. Vyborny, Heber MacMahon, Kunio Doi, Mircea Sabau
Author Affiliations +
Abstract
The effect of filter material on the properties of variable-thickness equalization filters for chest radiography was investigated. Filters made of nickel, tantalum, and lead which provided very similar improvements in mediastinal penetration were compared with regard to their scatter fractions, image contrasts and patient exposures. Their performances in these terms were found to be very similar, even though they produce considerably different x-ray spectra. The K edge filters (tantalum and lead) yielded slightly higher image contrast and patient exposure than did the non-K edge filter (nickel). The effect of filter material on contrast and exposure was less than the effect of usual patient-to-patient variation on these quantities, however.
© (1984) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carl J. Vyborny, Heber MacMahon, Kunio Doi, and Mircea Sabau "Variable-Thickness Chest Filtration: The Effect Of High Atomic Number Filter Materials", Proc. SPIE 0486, Medical Imaging and Instrumentation '84, (28 August 1984); https://doi.org/10.1117/12.943192
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image filtering

Nickel

Optical filters

Lead

Lung

Tantalum

Chest

RELATED CONTENT

Effect of a Multiple Scanning Beam Device and Trough Filter...
Proceedings of SPIE (September 19 1985)
Metal Foil Sandwiched Multiple Radiography
Proceedings of SPIE (November 01 1982)
Digital Image Processing In Chest Radiography
Proceedings of SPIE (June 12 1986)
A New Ansi Screen-Film-Processing Sensitometry Standard
Proceedings of SPIE (December 27 1977)
Comparison Of Chest Filters
Proceedings of SPIE (September 19 1985)
Improved Lung Nodule Detection With An Equalized Image
Proceedings of SPIE (August 18 1980)

Back to Top