Elliptical X-ray analyzer spectrograph application to a laser-produced plasma

Tina J. Tanaka; Merrill A. Palmer; Burton L. Henke

doi:10.1117/12.949657

6 May 1985 Elliptical X-ray analyzer spectrograph application to a laser-produced plasma

Tina J. Tanaka, Merrill A. Palmer, Burton L. Henke

Proceedings Volume 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics; (1985) https://doi.org/10.1117/12.949657
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

A preliminary experimental study was conducted on the application of an elliptical analyzer spectrograph to X-ray diagnostics of pulsed plasmas. This spectrograph was designed to record a range of 100-2000 eV X-rays on calibrated Kodak RAR-21497 film. Using point calibrations and theoretical models, the spectrograph efficiency was predicted. Basic spectrograph geometry and photographic calibrations are presented in companion papers. A 20 J, 6 ns duration Nd:glass laser pulse was focussed upon planar targets of gold, aluminum, teflon and boron carbide. Sample spectra for line and X-ray yields analysis are presented.

Citation Download Citation

Tina J. Tanaka, Merrill A. Palmer, and Burton L. Henke "Elliptical X-ray analyzer spectrograph application to a laser-produced plasma", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); https://doi.org/10.1117/12.949657

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