Simplified X-Ray Multilayer Reflectivity Calculations Using Lossy Transmission Line Theory

Paul D. Rockett; James H. Lupton

doi:10.1117/12.949686

6 May 1985 Simplified X-Ray Multilayer Reflectivity Calculations Using Lossy Transmission Line Theory

Paul D. Rockett, James H. Lupton

Proceedings Volume 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics; (1985) https://doi.org/10.1117/12.949686
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

Lossy transmission line theory is shown to be a physically meaningful technique for calculating the reflectivity of thin-film multilayer structures with complex indices of refraction. The problem is approached by treating each layer as a transmission line characterized by a given impedance. Reflections are naturally due to impedance mismatches; the impedance is shown to be simply the ratio of the electric and magnetic fields of the plane waves. Both normal and oblique incidence results match conventional calculations, but the transmission line approach requires minimal coding.

Citation Download Citation

Paul D. Rockett and James H. Lupton "Simplified X-Ray Multilayer Reflectivity Calculations Using Lossy Transmission Line Theory", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); https://doi.org/10.1117/12.949686

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