Objective Crystal Spectrometer (OXS) For Bragg Imaging Of Extended X-Ray Sources

Herbert W. Schnopper; Bjarne P. Byrnak

doi:10.1117/12.966595

14 July 1986 Objective Crystal Spectrometer (OXS) For Bragg Imaging Of Extended X-Ray Sources

Herbert W. Schnopper, Bjarne P. Byrnak

Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966595
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

There exists a need for a high resolution (E/ΔE >500-1000), imaging (~5x5 arcmin pixel) spectrometer which is capable of studying sources with appreciable angular extent (up to 1-2 deg) and which emits line spectra from a broad range of highly ionized plasmas (oxygen through iron). A large flat objective crystal couples nicely to a modest resolution but high throughput x-ray concentrating telescope to produce high dispersion images of diffuse x-ray sources in each of the several lines present in the spectrum. Unprecedented spectral resolution is provided for point sources and, provided that they do not vary on rapid time scales, a spectrum can be scanned over a wide energy range with unparalled sensitivity.

Citation Download Citation

Herbert W. Schnopper and Bjarne P. Byrnak "Objective Crystal Spectrometer (OXS) For Bragg Imaging Of Extended X-Ray Sources", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966595

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