Paper
13 October 1986 Systems Analysis Of Absorbing Media
Y K Lim, J S Seeley
Author Affiliations +
Proceedings Volume 0652, Thin Film Technologies II; (1986) https://doi.org/10.1117/12.938362
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
A complete treatment of the characteristic admittance-matrix representation of multilayer thin-film systems with absorbing media is presented. The algorithm from the systems' analysis is implemented on an IBM microcomputer and some examples of filter design calculations are presented. Relevant source code in IBM ADVANCED BASIC interpreter are also included.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y K Lim and J S Seeley "Systems Analysis Of Absorbing Media", Proc. SPIE 0652, Thin Film Technologies II, (13 October 1986); https://doi.org/10.1117/12.938362
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KEYWORDS
Thin films

Multilayers

Adaptive optics

Refractive index

Polarization

Electroluminescence

Magnetism

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