Paper
23 December 1986 Normal Incidence Performance Of Multilayer Thin-Film Structures Containing A Magneto-Optical Film
K Balasubramanian, H A Macleod
Author Affiliations +
Abstract
Calculations of the reflectance, transmittance, Kerr magneto-optical polarization rotation, and related constants are important in the design of multilayer thin-film media for magneto-optical disks for data storage. Different computation methods have been suggested in the literature for specific structures.1-3 We have established a powerful technique based on matrix methods and have written a program to calculate all the optical responses of multilayer structures. Calculations for a few specific models have been made, and these predict Kerr rotation angles > 2° for normal incidence. These calculations can be readily extended to different media structures. Oblique incidence calculations are also being incorporated. We feel that disk media designs can be analyzed very effectively with this technique.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K Balasubramanian and H A Macleod "Normal Incidence Performance Of Multilayer Thin-Film Structures Containing A Magneto-Optical Film", Proc. SPIE 0678, Optical Thin Films II: New Developments, (23 December 1986); https://doi.org/10.1117/12.939556
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Thin films

Magnetism

Multilayers

Reflectivity

Kerr effect

Signal to noise ratio

Dielectrics

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