Characterization Technique For Transparent Ion Conducting Films

K K. Wong; R. B. Goldner; G. H. Foley; L. Jauniskas; T. Haas; G. Seward

doi:10.1117/12.941872

12 November 1987 Characterization Technique For Transparent Ion Conducting Films

K K. Wong, R. B. Goldner, G. H. Foley, L. Jauniskas, T. Haas, G. Seward

Proceedings Volume 0823, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion VI; (1987) https://doi.org/10.1117/12.941872
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

In the development and production of transparent multilayer solid-state ionic structures, and in particular, electrochromic Smart Window the measurement of electron and ion transport properties of the layers is essential, since it can determine the feasibility as well as the speed of operation of devices with those layers. We are developing a novel electro-optical technique to measure the ion and electron mobilities of several layers of the electrochromic Smart Window^TM glass essentially in situ. Presented in this paper are the technique, preliminary models, and transport properties of two such films.

Citation Download Citation

K K. Wong, R. B. Goldner, G. H. Foley, L. Jauniskas, T. Haas, and G. Seward "Characterization Technique For Transparent Ion Conducting Films", Proc. SPIE 0823, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion VI, (12 November 1987); https://doi.org/10.1117/12.941872

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