Characterization Of Frequency Dispersion In Ti-Indiffused Lithium Niobate Optical Devices

J. L. Nightingale; R. A. Becker; P. C. Willis; J. S. Vrhel

doi:10.1117/12.942339

10 March 1988 Characterization Of Frequency Dispersion In Ti-Indiffused Lithium Niobate Optical Devices

J. L. Nightingale, R. A. Becker, P. C. Willis, J. S. Vrhel

Proceedings Volume 0835, Integrated Optical Circuit Engineering V; (1988) https://doi.org/10.1117/12.942339
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States

Abstract

The frequency dispersion of integrated optic interferometers fabricated on different lithium niobate cuts is characterized. Only the configuration that uses the r₃₃ electrooptic coefficient is well behaved.

Citation Download Citation

J. L. Nightingale, R. A. Becker, P. C. Willis, and J. S. Vrhel "Characterization Of Frequency Dispersion In Ti-Indiffused Lithium Niobate Optical Devices", Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); https://doi.org/10.1117/12.942339

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