Paper
1 June 1988 Quantitative Evaluation Of Interference Patterns
Thomas M. Kreis
Author Affiliations +
Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943488
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
The quantitative evaluation of interference patterns consists of the two steps of determining the interference phase at the points of interest and of combining the phase data with the geometry data. For each of these steps global and local or pointwise methods are presented and compared. Although the methods are applicable to the diverse types of interference patterns, they are presented here for the typical case of holographic interference patterns.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas M. Kreis "Quantitative Evaluation Of Interference Patterns", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); https://doi.org/10.1117/12.943488
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Cited by 16 scholarly publications.
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KEYWORDS
Fourier transforms

Holography

Phase shifts

Optoelectronics

Heterodyning

Interferometry

Holographic interferometry

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