Paper
3 October 1988 Thermal Wave Inspection Employing The Infrared Detection Technique
D P Almond, P M Patel, J D Morris, H Reiter
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Abstract
Thermal wave inspection is introduced with particular reference to the measurement and testing of surface coatings. Measurements are presented which demonstrate the effectiveness of the technique for assessing the thickness of plasma sprayed coatings and for detecting and imaging sub-surface defects. A new miniaturised testing system employing a high power semiconductor laser and a high collection efficiency infrared detector is described.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D P Almond, P M Patel, J D Morris, and H Reiter "Thermal Wave Inspection Employing The Infrared Detection Technique", Proc. SPIE 0917, Recent Developments and Applications of Infrared Analytical Instruments, (3 October 1988); https://doi.org/10.1117/12.945589
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Semiconductor lasers

Modulation

Infrared radiation

Reflection

Inspection

Interfaces

Thermography

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