Paper
1 January 1988 Aqueous Developable, Negative Working Resist Made Of Chlorinated Novolac Resin
H. Hiraoka, A. Patlach, Kaolin N. Chiong, Daniel Seligson, Piero Pianetta
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Abstract
Recently, three approaches to sub-micron imaging using negative working, aqueous developable, novolac resin or poly(hydroxystyrene)-based resists have been reported: (1) Image reversal of positive working photoresists (2) Acid hardenable resist with post-bake process, and (3) Contrast enhanced-resist with deep uv flood exposure. Negative working resists with high resolution are important for fabrication of advanced devices. In the present study we examine a simple two component system consisting of a chlorinated novolac resin and an aromatic bisazide suitable for uv, electron and x-ray exposure. The resist is conventionally processed in aqueous developer, and provides negative working resist images with 0.25 μm space and line resolution without swelling or scum.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. Hiraoka, A. Patlach, Kaolin N. Chiong, Daniel Seligson, and Piero Pianetta "Aqueous Developable, Negative Working Resist Made Of Chlorinated Novolac Resin", Proc. SPIE 0920, Advances in Resist Technology and Processing V, (1 January 1988); https://doi.org/10.1117/12.968310
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KEYWORDS
Electron beams

Photoresist processing

Image processing

Synchrotron radiation

X-rays

Image resolution

Photoresist materials

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