Paper
1 January 1988 Zero-Misalignment Lithographic Process Using A Photoresist With Wavelength-Selected Tone
William D. Hinsberg, Scott A. MacDonald, Lester A. Pederson, C. Grant Willson
Author Affiliations +
Abstract
A novel photoresist capable of dual-tone imaging, and a self-aligning two-level lithographic process which demonstrates its unique properties are described. This resist, composed of a positive and a negative photosensitizer in a phenolic matrix resin, can be imaged in either tone depending on the wavelength of exposure. In the self-aligned process, two distinct latent images, one in positive and one in negative tone, are generated simultaneously during a single exposure using a special mask. The latent images can be developed separately and independently. The alignment between these patterns is defined by the mask and is identical from wafer to wafer. The two patterns can be transferred to the substrate sequentially and with zero alignment error.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William D. Hinsberg, Scott A. MacDonald, Lester A. Pederson, and C. Grant Willson "Zero-Misalignment Lithographic Process Using A Photoresist With Wavelength-Selected Tone", Proc. SPIE 0920, Advances in Resist Technology and Processing V, (1 January 1988); https://doi.org/10.1117/12.968295
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CITATIONS
Cited by 1 scholarly publication and 5 patents.
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KEYWORDS
Photoresist processing

Photomasks

Metals

Lithography

Etching

Oxides

Image processing

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