Infrared Sensor Test Requirements And Critical Issues

Thomas F. Greene

doi:10.1117/12.947136

14 July 1988 Infrared Sensor Test Requirements And Critical Issues

Thomas F. Greene

Proceedings Volume 0940, Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling; (1988) https://doi.org/10.1117/12.947136
Event: 1988 Technical Symposium on Optics, Electro-Optics, and Sensors, 1988, Orlando, FL, United States

Abstract

The primary focus of this paper is long wavelength infrared sensor calibration. The success or failure of a calibration program is determined long before calibration time by the quality of the prior sensor design and test program. Failure to adhere to any one of several important test principles can lead to difficulties in calibration and flight. If test and calibration are not given high priority during sensor design, flight performance may be compromised because calibration and functional testing will be difficult. A test and calibration facility is virtually required to accomplish the many different tests essential for sensor acceptance and calibration. A number of critical issues remain to be resolved, and a number of new requirements must be accommodated in future test and calibration facility design.

Citation Download Citation

Thomas F. Greene "Infrared Sensor Test Requirements And Critical Issues", Proc. SPIE 0940, Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling, (14 July 1988); https://doi.org/10.1117/12.947136

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