FLIR Characterization: Yesterday And Today

Gerald C. Holst

doi:10.1117/12.947170

4 August 1988 FLIR Characterization: Yesterday And Today

Gerald C. Holst

Proceedings Volume 0941, Automated Testing of Electro-Optical Systems; (1988) https://doi.org/10.1117/12.947170
Event: 1988 Technical Symposium on Optics, Electro-Optics, and Sensors, 1988, Orlando, FL, United States

Abstract

A variety of modern test equipment is available to measure the NEDT, SITF, MRT, and MTF of thermal imaging systems. Since this equipment processes data in the digital domain, it may introduce artifacts such as image blurring, uncertainty in edge location and aliasing. These effects are pronounced in undersampled situations which may be encountered with frame grabbers or image analyzers. Although the performance measures are usually specified in terms of target-background temperature differential, thermal imaging systems respond to power or photon differences. Since power differences are not linearly related to temperature differences, the NEDT, SITF and MRT are functions of the ambient temperature.

Citation Download Citation

Gerald C. Holst "FLIR Characterization: Yesterday And Today", Proc. SPIE 0941, Automated Testing of Electro-Optical Systems, (4 August 1988); https://doi.org/10.1117/12.947170

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