Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers

J. E. Keem; J. Wood; N. Grupido; K. Hart; S. Nutt; D. G. Reichel; W. B. Yelon

doi:10.1117/12.948745

18 January 1989 Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers

J. E. Keem, J. Wood, N. Grupido, K. Hart, S. Nutt, D. G. Reichel, W. B. Yelon

Proceedings Volume 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides; (1989) https://doi.org/10.1117/12.948745
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

Analysis of Ni-Ti multilayer neutron reflectors and supermirrors has been undertaken to identify the causes of the lower than expected observed scattering power and critical angle enhancement of Ni-Ti supermirrors. Results of these investigations have focused attention on cusp formation in the Ni-Ti bilayers as probable cause for the reduced neutron scattering power. Grazing angle x-ray and neutron scattering, wide angle neutron diffraction and analytical cross sectional TEM have been used in this investigation. The multilayers were produced by magnetron sputtering and ion-beam deposition on float glass substrates and silicon wafers.

Citation Download Citation

J. E. Keem, J. Wood, N. Grupido, K. Hart, S. Nutt, D. G. Reichel, and W. B. Yelon "Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers", Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); https://doi.org/10.1117/12.948745

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