Dark current measurements at low focal plane temperature

L. Martineau; J. Berthoz; L. Rubaldo

doi:10.1117/12.2242570

19 October 2016 Dark current measurements at low focal plane temperature

L. Martineau, J. Berthoz, L. Rubaldo

Proceedings Volume 10000, Sensors, Systems, and Next-Generation Satellites XX; 100000O (2016) https://doi.org/10.1117/12.2242570
Event: SPIE Remote Sensing, 2016, Edinburgh, United Kingdom

Abstract

Spatial applications are challenging infrared (IR) technologies requiring the best system performances. Usually, the need is a trade-off between the spatial response and signal to noise ratio (SNR) of the IR detector, and in particular the dark current performance. Measuring dark current performances for IR detectors at low temperature require an understanding of detector physics, readout circuit design and also test equipment limitation. This paper describes possible issues associated with dark current measurements on n-on-p Mercury Cadmium Telluride (MCT) pixel design.

Citation Download Citation

L. Martineau, J. Berthoz, and L. Rubaldo "Dark current measurements at low focal plane temperature", Proc. SPIE 10000, Sensors, Systems, and Next-Generation Satellites XX, 100000O (19 October 2016); https://doi.org/10.1117/12.2242570

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