Reconstructing spectral reflectance from digital camera through samples selection

Bin Cao; Ningfang Liao; Wenming Yang; Haobo Chen

doi:10.1117/12.2245278

31 October 2016 Reconstructing spectral reflectance from digital camera through samples selection

Bin Cao, Ningfang Liao, Wenming Yang, Haobo Chen

Proceedings Volume 10020, Optoelectronic Imaging and Multimedia Technology IV; 100200D (2016) https://doi.org/10.1117/12.2245278
Event: SPIE/COS Photonics Asia, 2016, Beijing, China

Abstract

Spectral reflectance provides the most fundamental information of objects and is recognized as the “fingerprint” of them, since reflectance is independent of illumination and viewing conditions. However, reconstructing high-dimensional spectral reflectance from relatively low-dimensional camera outputs is an illposed problem and most of methods requaired camera’s spectral responsivity. We propose a method to reconstruct spectral reflectance from digital camera outputs without prior knowledge of camera’s spectral responsivity. This method respectively averages reflectances of selected subset from main training samples by prescribing a limit to tolerable color difference between the training samples and the camera outputs. Different tolerable color differences of training samples were investigated with Munsell chips under D65 light source. Experimental results show that the proposed method outperforms classic PI method in terms of multiple evaluation criteria between the actual and the reconstructed reflectances. Besides, the reconstructed spectral reflectances are between 0-1, which make them have actual physical meanings and better than traditional methods.

Citation Download Citation

Bin Cao, Ningfang Liao, Wenming Yang, and Haobo Chen "Reconstructing spectral reflectance from digital camera through samples selection", Proc. SPIE 10020, Optoelectronic Imaging and Multimedia Technology IV, 100200D (31 October 2016); https://doi.org/10.1117/12.2245278

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