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28 March 2017 Front Matter: Volume 10097
This PDF file contains the front matter associated with SPIE Proceedings Volume 10097, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

31 January–2 February 2017

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Volume 10097

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Author(s), “Title of Paper,” in High-Power Laser Materials Processing: Applications, Diagnostics, and Systems VI, edited by Stefan Kaierle, Stefan W. Heinemann, Proceedings of SPIE Vol. 10097 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510606357

ISBN: 9781510606364 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abe, Tamotsu, 02

Aoki, Toru, 0G

Ashkenasi, David, 0N

Aubignat, Emilie, 0P

Barré, Nicolas, 05

Bauer, William A., 0H

Baumbach, N., 0J

Beckert, Erik, 0D

Bjelajac, Goran, 0F

Bluemel, Sven, 0Q

Boley, Meiko, 09

Burkhardt, Thomas, 0D

Costil, Sophie, 0P

Courant, Bruno, 0P

Damm, Christoph, 0D

de Vries, Oliver, 0D

Dorsch, F., 08

Dubitzky, W., 08

Eberhardt, Ramona, 0K

Effing, L., 08

Eilzer, Sebastian, 0L

Faupel, Benedikt, 0A

Ferrario, Fabio, 0N

Fetissow, Sebastian, 0N

Fetzer, Florian, 09

Fritsche, Haro, 0N

Fujimoto, Junichi, 0T

Funck, Max C., 0L

Garcia, Lionel, 05

García-Díaz, Antón, 0B

Gillet, Vincent, 0P

Gonzales, Ashley E., 0H

Goy, Matthias, 0K

Graf, Thomas, 09

Gries, Wolfgang, 0N

Grishkanich, Alexsandr, 0S

Grohe, Andreas, 0N

Guertler, Yvonne, 06

Hagen, Thomas, 0N

Harrer, Thomas, 0E

Harrop, Nicholas J., 0O

Haug, P., 08

Havrilla, David, 06

Heinrici, Axel, 0F

Hermani, J.-P., 08

Herr, Nicholas C., 0H

Hollwich, Jan, 0A

Hori, Tsukasa, 02

Hornaff, Marcel, 0D

Hustedt, Michael, 0Q

Iakovlev, Alexey, 0S

Jaeschke, Peter, 0Q

Jaffrès, Lionel, 05

Jakobs, Stefan, 0F

Jedamzik, Ralf, 03

Jian, Pu, 05

Jonkers, Jeroen, 0F, 0J

Kahmann, Max, 06

Kaierle, Stefan, 0Q

Kakizaki, Koji, 0T

Karam, J., 0J

Kascheev, Sergey, 0S

Katzemaikat, Tristan, 0N

Kawasuji,, Yasufumi, 02

Kessler, Steffen, 0E

Kinast, Jan, 0D

Knapp, Wolfgang, 0P

Kobayashi, Masakazu, 0T

Kodama, Takeshi, 02

Koek, Wouter D., 04

Kokhan, Maksym, 0G

Koleshnia, Ilona, 0G

Kopf, Teresa, 0K

Kramer, Reinhard, 0O

Kühl, P., 0J

Labroille, Guillaume, 05

Langebach, Jan, 0K

Langlade, Cécile, 0P

Maerten, Otto, 0O

Matsunaga, Takashi, 0T

Mäusezahl, Max, 0D

Mimura, Toshio, 0T

Mizoguchi, Hakaru, 02, 0T

Morizur, Jean-François, 05

Mosbach, Benedikt, 0A

Müllegger, Andreas, 0M

Müller, Norbert, 0N

Nakarai, Hiroaki, 02

Nijkerk, David, 04

Nowak, Krzysztof M., 02

Oizumi, Hiroaki, 0T

Okazaki, Shinji, 02

Olschok, Simon, 0F

Parfenov, V., 0S

Perram, Glen P., 0H

Petzold, Uwe, 03

Phillips, Grady T., 0H

Pinel, Olivier, 05

Plasswich, S., 08

Reinlein, Claudia, 0K

Reisgen, Uwe, 0F

Reyes, M., 0J

Rodríguez-Araújo, Jorge, 0B

Ruzankina, Julia, 0S

Ryba, Tracey, 0M

Saitou, Takashi, 02

Schaefer, Marcel, 0E

Scheible, Philipp, 0E

Scheller, Torsten, 0K

Shiraishi, Yutaka, 02

Smeltink, Jeroen A., 04

Speker, Nicolai, 0E

Steger, Ronny, 0N

Tanaka, Hiroshi, 02

van Baars, Gregor E., 04

van den Dool, Teun C., 04

van Zwet, Erwin J., 04

Vasilyev, Oleg, 0S

Villarreal-Saucedo, F., 0J

Walter, Juergen, 0Q

Watanabe, Yukio, 02

Weber, Rudolf, 09

Wedel, Björn, 0L

Wolf, Stefan, 0O

Yamada, Tsuyoshi, 02

Yamazaki, Taku, 02

Yanagida, Tatsuya, 02

Zäh, Ralf-Kilian, 0A

Zelensky, Serge E., 0G

Conference Committee

Symposium Chairs

  • Reinhart Poprawe, Fraunhofer-Institut für Lasertechnik (Germany)

  • Koji Sugioka, RIKEN (Japan)

Symposium Co-chairs

  • Guido Hennig, Daetwyler Graphics AG (Switzerland)

  • Yongfeng Lu, University of Nebraska-Lincoln (United States)

Program Track Chairs

  • Bo Gu, Bos Photonics (United States)

  • Stefan Kaierle, Laser Zentrum Hannover e.V. (Germany)

Conference Chairs

  • Stefan Kaierle, Laser Zentrum Hannover e.V. (Germany)

  • Stefan W. Heinemann, TRUMPF Photonics (United States)

Conference Program Committee

  • Bo Gu, Bos Photonics (United States)

  • Klaus R. Kleine, Coherent, Inc. (United States)

  • Annett Klotzbach, Fraunhofer IWS Dresden (Germany)

  • Wolfgang Knapp, Cooperation Laser Franco-Allemande (France)

  • Lin Li, The University of Manchester (United Kingdom)

  • Silke Pflueger, DirectPhotonics, Inc. (United States)

  • Stephan Roth, BLZ Bayerisches Laserzentrum GmbH (Germany)

  • Leonardo D. Scintilla, Politecnico di Bari (Italy)

  • Stefaan Vandendriessche, Edmund Optics Inc. (United States)

  • Kunihiko Washio, Paradigm Laser Research Ltd. (Japan)

Session Chairs

  • 1 Beam Shaping I: Joint Session with Conferences 10090 and 10097

    Stefaan Vandendriessche, Edmund Optics Inc. (United States)

  • 2 Beam Shaping II: Joint Session with Conferences 10090 and 10097

    Vladimir S. Ilchenko, OEwaves, Inc. (United States)

    Michael J. Scaggs, Neoteric Concepts, LLC (United States)

  • 3 Process Monitoring and Control

    Stefan Kaierle, Laser Zentrum Hannover e.V. (Germany)

  • 4 Joining and Welding

    Stefan W. Heinemann, TRUMPF Photonics (United States)

  • 5 Process Diagnostics

    Stefan W. Heinemann, TRUMPF Photonics (United States)

  • 6 Beam Manipulation, Transport, and Measurement

    Bo Gu, Bos Photonics (United States)

  • 7 Surface Treatment I

    Klaus R. Kleine, Coherent, Inc. (United States)

  • 8 Surface Treatment II

    Wolfgang Knapp, Cooperation Laser Franco-Allemande (France)

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10097", Proc. SPIE 10097, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems VI, 1009701 (28 March 2017);

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