The Precision Measurement Of Engineering Form By Computer Analysis Of Optically Generated Contours

David R. Burton; Michael J. Lalor

doi:10.1117/12.949194

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15 February 1989 The Precision Measurement Of Engineering Form By Computer Analysis Of Optically Generated Contours

David R. Burton, Michael J. Lalor

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Proceedings Volume 1010, Industrial Inspection; (1989) https://doi.org/10.1117/12.949194
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany

Abstract

The rapid, ultra-precision measurement of the shape of engineering components is becominc; a major requirement for today's quality conscious industries. This paper presents a technique for the reconstruction of surfaces underlying optically generated contour maps. The technique views the map as a constant spacing straight fringe pattern phase modulated by the underlying surface shape. The Fourier transform is used as a means of demodulating the pattern producing a 2π wrapped phase distribution. The conversion of this phase information to a range map is performed and so the surface is reconstructed. Methods for the quantitative analysis of the resulting map are discussed, including techniques based on differential geometric analysis, to yield data on items such as the first and second fundamental forms and hence functionally important criteria such as point surface principal curvature etc. The relationship which exists between the accuracy of these measurements and the nature of the demodulation filtering performed in the Fourier domain is briefly discussed.

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David R. Burton and Michael J. Lalor "The Precision Measurement Of Engineering Form By Computer Analysis Of Optically Generated Contours", Proc. SPIE 1010, Industrial Inspection, (15 February 1989); https://doi.org/10.1117/12.949194

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