Future of high-speed short-reach interconnects using clad-dielectric waveguide

J. Y. Lee; H. I. Song; S. W. Kwon; H. M. Bae

doi:10.1117/12.2249252

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20 February 2017 Future of high-speed short-reach interconnects using clad-dielectric waveguide

J. Y. Lee, H. I. Song, S. W. Kwon, H. M. Bae

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Proceedings Volume 10109, Optical Interconnects XVII; 1010903 (2017) https://doi.org/10.1117/12.2249252
Event: SPIE OPTO, 2017, San Francisco, California, United States

Abstract

The ever-increasing demand for bandwidth requires advanced interconnect solutions satisfying functional and economic constraints. A new interconnect called electrical tube (E-TUBE) is proposed as a cost-and-power-effective all-electricaldomain wideband waveguide solution for high-speed, high-volume, and short-reach communication links. Unlike conventional optical solutions, the E-TUBE achieves state-of-the-art performance in terms of bandwidth-per-carrier frequency, power, and density without any precision manufacturing process. The E-TUBE exhibits a frequencyindependent loss-profile and has 20GHz bandwidth over the V band. The inherent frequency response of the E-TUBE enables a single-sideband signal transmission and renders double data throughput without any physical overhead. Transmission up to 14Gb/s signals over 1.2m has been tested using 73GHz carrier frequency (f_C). The IC is fabricated in 40nm CMOS and the figure-of-merit of the interface is 0.52J/b/m×*fC (Radio frequency circuits only: 0.3J/b/m×*fC).

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J. Y. Lee, H. I. Song, S. W. Kwon, and H. M. Bae "Future of high-speed short-reach interconnects using clad-dielectric waveguide", Proc. SPIE 10109, Optical Interconnects XVII, 1010903 (20 February 2017); https://doi.org/10.1117/12.2249252

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