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25 October 2016 Infrared detectors and test technology of cryogenic camera
Xiaole Yang, Xingxin Liu, Mailing Xing, Long Ling
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Proceedings Volume 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control; 101571H (2016) https://doi.org/10.1117/12.2246503
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
Cryogenic camera which is widely used in deep space detection cools down optical system and support structure by cryogenic refrigeration technology, thereby improving the sensitivity. Discussing the characteristics and design points of infrared detector combined with camera’s characteristics. At the same time, cryogenic background test systems of chip and detector assembly are established. Chip test system is based on variable cryogenic and multilayer Dewar, and assembly test system is based on target and background simulator in the thermal vacuum environment. The core of test is to establish cryogenic background. Non-uniformity, ratio of dead pixels and noise of test result are given finally. The establishment of test system supports for the design and calculation of infrared systems.
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Xiaole Yang, Xingxin Liu, Mailing Xing, and Long Ling "Infrared detectors and test technology of cryogenic camera", Proc. SPIE 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control, 101571H (25 October 2016); https://doi.org/10.1117/12.2246503
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KEYWORDS
Cryogenics
Cameras
Infrared detectors
Sensors
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