Development of nanostructured antireflection coatings for infrared image sensing technologies

Gopal G. Pethuraja; John W. Zeller; Roger E. Welser; Ashok K. Sood; Harry Efstathiadis; Pradeep Haldar; Eric A. DeCuir Jr.; Priyalal S. Wijewarnasuriya; Nibir K. Dhar

doi:10.1117/12.2268856

18 May 2017 Development of nanostructured antireflection coatings for infrared image sensing technologies

Gopal G. Pethuraja, John W. Zeller, Roger E. Welser, Ashok K. Sood, Harry Efstathiadis, Pradeep Haldar, Eric A. DeCuir Jr., Priyalal S. Wijewarnasuriya, Nibir K. Dhar

Author Affiliations +

Proceedings Volume 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV; 102090D (2017) https://doi.org/10.1117/12.2268856
Event: SPIE Commercial + Scientific Sensing and Imaging, 2017, Anaheim, CA, United States

Abstract

Image sensing technologies and systems operating from the ultraviolet (UV) to long-wave infrared (LWIR) spectral range are being developed for a variety of defense and commercial systems applications. Reflection loss of a significant portion of the incident signal limits the performance of image sensing systems. One of the critical technologies that will overcome this limitation and enhance image sensor performance is the development of advanced antireflection (AR) coatings. In this paper, we review our latest work on high-quality nanostructure-based AR structures, including recent efforts to deposit nanostructured AR coatings on substrates transparent to infrared (IR) radiation. Nanostructured AR coatings fabricated via a scalable self-assembly process are shown to enhance the optical transmission through transparent optical components by minimizing reflection losses in the spectral band of interest to less than one percent, a substantial improvement over conventional thin-film AR coating technologies. Step-graded AR structures also exhibit excellent omnidirectional performance, and have recently been demonstrated in medium wavelength and long wavelength IR spectral bands.

Citation Download Citation

Gopal G. Pethuraja, John W. Zeller, Roger E. Welser, Ashok K. Sood, Harry Efstathiadis, Pradeep Haldar, Eric A. DeCuir Jr., Priyalal S. Wijewarnasuriya, and Nibir K. Dhar "Development of nanostructured antireflection coatings for infrared image sensing technologies", Proc. SPIE 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV, 102090D (18 May 2017); https://doi.org/10.1117/12.2268856

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
9 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Antireflective coatings

Nanostructuring

Transmittance

Glasses

Silicon

Reflectivity

Infrared imaging

Show All Keywords

Keywords/Phrases

Search In:

Publication Years