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2 May 2005 Phase retrieval as an optical metrology tool; Technical Digest
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Abstract
Phase retrieval can be useful in the measurement of optical surfaces and systems. It distinguishes itself through the simplicity of the experimental apparatus, just a detector array which collects light near a focal plane. Aspherics can be measured without null optics. The challenging part of the method is the estimation of the wavefront from the near-focus intensity measurements to reconstruct the wavefront.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gregory R. Brady and James R. Fienup "Phase retrieval as an optical metrology tool; Technical Digest", Proc. SPIE 10315, Optifab 2005: Technical Digest, 1031517 (2 May 2005); https://doi.org/10.1117/12.605914
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