Optical residual stress measurement in TFT-LCD panels

Wei-Chung Wang; Po-Chi Sung

doi:10.1117/12.2276583

26 June 2017 Optical residual stress measurement in TFT-LCD panels

Wei-Chung Wang, Po-Chi Sung

Proceedings Volume 10329, Optical Measurement Systems for Industrial Inspection X; 103291R (2017) https://doi.org/10.1117/12.2276583
Event: SPIE Optical Metrology, 2017, Munich, Germany

Abstract

The residual stress of the glass substrate might be one of causes to produce the non-uniform light distribution defect, i.e. Mura, in thin film transistor-liquid crystal display (TFT-LCD) panels. Glass is a birefringent material with very low birefringence. Furthermore, the thinner and thinner thickness request from the market makes the traditional photoelasticity almost impossible to measure the residual stresses produced in thin glass plates. Recently, a low-level stress measurement method called transmissivity extremities theory of photoelasticity (TEToP) was successfully developed to measure the residual stress in glass plate. Besides, to measure the stress of the glass plate in the TFT-LCD panel whose rear surface may has different kinds of coatings, an advanced reflection photoelasticity was also developed. In this paper, three commercially available glass plates with 0.33mm nominal thickness and three glass circular disks with different coatings were inspected to verify the feasibility of the TEToP and the advanced reflection photoelasticity, respectively.

Citation Download Citation

Wei-Chung Wang and Po-Chi Sung "Optical residual stress measurement in TFT-LCD panels", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103291R (26 June 2017); https://doi.org/10.1117/12.2276583

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