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23 August 2017 Advances toward submicron resolution optics for x-ray instrumentation and applications
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Abstract
Sigray’s axially symmetric x-ray optics enable advanced microanalytical capabilities for focusing x-rays to microns-scale to submicron spot sizes, which can potentially unlock many avenues for laboratory micro-analysis. The design of these optics allows submicron spot sizes even at low x-ray energies, enabling research into low atomic number elements and allows increased sensitivity of grazing incidence measurements and surface analysis. We will discuss advances made in the fabrication of these double paraboloidal mirror lenses designed for use in laboratory x-ray applications. We will additionally present results from as-built paraboloids, including surface figure error and focal spot size achieved to-date.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark Cordier, Benjamin Stripe, Wenbing Yun, S. H. Lau, Alan Lyon, David Reynolds, Sylvia J. Y. Lewis, Sharon Chen, Vladimir A. Semenov, Richard I. Spink, and Srivatsan Seshadri "Advances toward submicron resolution optics for x-ray instrumentation and applications", Proc. SPIE 10386, Advances in X-Ray/EUV Optics and Components XII, 103860D (23 August 2017); https://doi.org/10.1117/12.2273094
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