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19 September 2017 Diffraction efficiency of a replicated large-format x-ray reflection grating (Conference Presentation)
Drew M. Miles, Jake McCoy, Randall L. McEntaffer, Casey T. DeRoo
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Proceedings Volume 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII; 1039913 (2017) https://doi.org/10.1117/12.2272605
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States
Abstract
Future soft X-ray spectroscopy missions have science requirements that demand higher instrument throughput and higher resolution than currently available technology. A key element in such spectrometers are dispersive elements such as diffraction gratings. Our group at Penn State University develops and fabricates off-plane reflection gratings in an effort to achieve the level of performance required by future missions. We present here efficiency measurements made in the 0.2 – 1.3 keV energy band at the Advanced Light Source (ALS) at Lawrence Berkley National Laboratory for one such grating, which was fabricated to achieve the high-throughput required for future observatories. This grating was replicated from a grating master using UV-nanoimprint techniques which are suitable for mass-production and is coated in a layer of gold. Total absolute diffraction efficiency was measured to be ~55-65% across the energy range, with relative diffraction efficiency approaching 90%. These results represent the first successful demonstration of off-plane grating replicas produced via these fabrication techniques and exceed the grating efficiency requirements for future X-ray missions.
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Drew M. Miles, Jake McCoy, Randall L. McEntaffer, and Casey T. DeRoo "Diffraction efficiency of a replicated large-format x-ray reflection grating (Conference Presentation)", Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 1039913 (19 September 2017); https://doi.org/10.1117/12.2272605
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KEYWORDS
Diffraction gratings
X-rays
Diffraction
Imaging spectroscopy
Spectroscopes
Energy efficiency
X-ray diffraction
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