In-situ stress measurement of single and multilayer thin-films used in x-ray astronomy optics applications

David M. Broadway; Brian D. Ramsey; Stephen L. O'Dell; Danielle Gurgew

doi:10.1117/12.2275558

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8 September 2017 In-situ stress measurement of single and multilayer thin-films used in x-ray astronomy optics applications

David M. Broadway, Brian D. Ramsey, Stephen L. O'Dell, Danielle Gurgew

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Proceedings Volume 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII; 103991B (2017) https://doi.org/10.1117/12.2275558
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

We present in-situ stress measurement results for single and multilayer thin-films deposited by magnetron sputtering. In particular, we report on the influence of the material interfaces on the ensuing stress in both the transient and steady-state regimes of film growth. This behavior is used to determine the appropriate thicknesses of the constituent layers that will result in a net tensile stress in multilayers composed of various material combinations. These multilayers can then be used to compensate the compressive integrated stress in single and multilayer EUV and x-ray optical coatings. The use of multilayers to compensate the integrated stress might be advantageous because, unlike single layers of chromium, the roughness is not expected to increase with the total thickness of the multilayer. In this paper, we demonstrate the technique for W/Si and Mo/Si multilayers and discuss its application to other material combinations.

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David M. Broadway, Brian D. Ramsey, Stephen L. O'Dell, and Danielle Gurgew "In-situ stress measurement of single and multilayer thin-films used in x-ray astronomy optics applications", Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 103991B (8 September 2017); https://doi.org/10.1117/12.2275558

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