A method for the determination of defect density from standard damage frequency measurements

Jonathan W. Arenberg; Carmen Menoni

doi:10.1117/12.2280611

13 November 2017 A method for the determination of defect density from standard damage frequency measurements

Jonathan W. Arenberg, Carmen Menoni

Author Affiliations +

Proceedings Volume 10447, Laser-Induced Damage in Optical Materials 2017; 104471R (2017) https://doi.org/10.1117/12.2280611
Event: SPIE Laser Damage, 2017, Boulder, Colorado, United States

Abstract

This paper presents a method to make an estimation of the low fluence edge of the defect distribution, ρ(φ), from data collected from ISO 21254 standard damage frequency measurements. The cumulative probability of damage is formulated and the defect distribution is formulated as an expansion of an orthonormal set. This formulation allows the explicit isolation of the terms pertaining to the defect distribution and the intensity distribution. When the intensity distribution is specified, the resulting system is a polynomial in nature. Solutions for the systems relevant for Gaussian and are presented.

Citation Download Citation

Jonathan W. Arenberg and Carmen Menoni "A method for the determination of defect density from standard damage frequency measurements", Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471R (13 November 2017); https://doi.org/10.1117/12.2280611

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE