Paper
13 June 2017 Comparison between ternary and binary Gray-code-based phase unwrapping methods
Author Affiliations +
Proceedings Volume 10449, Fifth International Conference on Optical and Photonics Engineering; 104491V (2017) https://doi.org/10.1117/12.2270773
Event: Fifth International Conference on Optical and Photonics Engineering, 2017, Singapore, Singapore
Abstract
Phase-shifting profilometry using binary patterns with projector defocusing has been widely used for high-speed 3D measurement. Recently, a ternary Gray-code based phase unwrapping method has been proposed, which enables to accurately unwrap the phase but reduces the required binary patterns. This paper presents a comparison between the ternary and the traditional binary Gray code-based phase unwrapping methods.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dongliang Zheng, Qian Kemao, Feipeng Da, and Hock Soon Seah "Comparison between ternary and binary Gray-code-based phase unwrapping methods", Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 104491V (13 June 2017); https://doi.org/10.1117/12.2270773
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KEYWORDS
3D metrology

Phase shifts

Projection systems

Fringe analysis

Phase measurement

3D scanning

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