Finite Element Analysis Of Thermal Transients In Multi-Stripe Laser Diode Arrays

Wendy L. Lippincott; Anne E. Clement

doi:10.1117/12.951326

31 May 1989 Finite Element Analysis Of Thermal Transients In Multi-Stripe Laser Diode Arrays

Wendy L. Lippincott, Anne E. Clement

Proceedings Volume 1045, Modeling and Simulation of Laser Systems; (1989) https://doi.org/10.1117/12.951326
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

The NASTRAN finite element code was used to simulate the temperature transients in the active area of laser diode arrays caused by driving the array with a pulsed waveform. A ten-stripe multi-quantum-well (MQW) structure was used. The thermal impedance of the array was also determined and compared to experimental values obtained by monitoring the threshold dependance of the device during pulsed and cw operation. The single-stripe diode was also modeled for comparison purposes.

Citation Download Citation

Wendy L. Lippincott and Anne E. Clement "Finite Element Analysis Of Thermal Transients In Multi-Stripe Laser Diode Arrays", Proc. SPIE 1045, Modeling and Simulation of Laser Systems, (31 May 1989); https://doi.org/10.1117/12.951326

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