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22 February 2018 Universal test system for system embedded optical interconnect
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Proceedings Volume 10538, Optical Interconnects XVIII; 1053804 (2018)
Event: SPIE OPTO, 2018, San Francisco, California, United States
We introduce a universal test and measurement system allowing comparative characterisation of optical transceivers, board-to-board optical connectors and both embedded and passive optical circuit boards. The system comprises a test enclosure with interlocking and interchangeable test cards, allowing different technologies spanning different Technology Readiness Levels to be both characterised alone and in combination with other technologies. They form part of the open test design standards portfolio developed on the FP7 PhoxTroT and H2020 COSMICC projects and allow testing on a common test platform.
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R. Pitwon, K. Wang, M. Immonen, H. Schröder, and M. Neitz "Universal test system for system embedded optical interconnect", Proc. SPIE 10538, Optical Interconnects XVIII, 1053804 (22 February 2018);

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