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5 July 2018 Front Matter: Volume 10548
This PDF file contains the front matter associated with SPIE Proceedings Volume10548, including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

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Author(s), “Title of Paper,” in Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI, edited by Selim M. Shahriar, Jacob Scheuer, Proceedings of SPIE Vol. 10548 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510615816

ISBN: 9781510615823 (electronic)

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Al-Amri, M., 0N

Alem, O., 1G

Andryushkov, Valerii, 20

Barbieri, C., 1K

Boyd, Robert W., 06

Canoza, Philip, 1X

Casillas, Nayeli, 04

Davis, Jon P., 1Y

Digonnet, Michel J. F., 0S

Dudley, Jordan, 1X

Evans, Dean R., 0X

Feng, Cheng, 0U

Gao, Lirun, 12

García, S., 0J

Gasulla, I., 0J

Grant, Matthew J., 0S

Hernández, Eliseo, 04

Hu, Changyu, 06

Khripunov, Sergey, 20

Kobtsev, Sergey, 20

Li, Chao, 12

Ma, Kai, 0F, 0H

Malek, Bola, 1X

Manicchia, Michael, 1Y

Mathey, Pierre, 0X

Meldrum, Aaron, 1Y

Müller, Holger, 1X

Naletto, G., 1K

Narducci, Frank A., 1Y

Occhipinti, T., 1K

Ocegueda, Manuel, 04

O'Faolain, Liam, 06

Orton, J., 1G

Osborne, J., 1G

Pagel, Zachary, 1X

Popkov, Ivan, 20

Preussler, Stefan, 0U

Radnatarov, Daba, 20

Rosenberger, A. T., 0G

Scheuer, Jacob, 09

Schneider, Thomas, 0U

Schulz, Sebastian A., 06

Shah, V., 1G

Shcherbin, Konstantin, 0X

Stepanov, Serguei, 04

Steschenko, Tatiana, 20

Su, Huaiyin, 0F, 0H

Upham, Jeremy, 06

Wu, Xuejian, 1X

Xian, Tian-hao, 12

Yuan, Ping, 0F, 0H

Zampieri, L., 1K

Zeng, Xiaodong, 0N

Zhan, Li, 12

Zhang, Wen-yan, 12

Zhang, Yundong, 0F, 0H

Zhao, Yongpeng, 0F

Zi, Fei, 1X

Zubairy, M. Suhail, 0N

Conference Committee

Symposium Chairs

  • Connie J. Chang-Hasnain, University of California, Berkeley (United States)

  • Graham T. Reed, Optoelectronics Research Centre, University of Southampton (United Kingdom)

Symposium Co-chairs

  • Jean-Emmanuel Broquin, IMEP-LAHC (France)

  • Shibin Jiang, AdValue Photonics, Inc. (United States)

Program Track Chair

  • David L. Andrews, University of East Anglia (United Kingdom)

Conference Chairs

  • Selim M. Shahriar, Northwestern University (United States)

  • Jacob Scheuer, Tel Aviv University (Israel)

Conference Program Committee

  • Robert W. Boyd, University of Ottawa (Canada) and University of Rochester (United States)

  • Danielle A. Braje, MIT Lincoln Laboratory (United States)

  • John H. Burke, Air Force Research Laboratory (United States)

  • Brian D’Urso, University of Pittsburgh (United States)

  • Daniel J. Gauthier, The Ohio State University (United States)

  • Andrew Geraci, University of Nevada, Reno (United States)

  • Kohzo Hakuta, The University of Electro-Communications (Japan)

  • John C. Howell, University of Rochester (United States)

  • Jacob B. Khurgin, Johns Hopkins University (United States)

  • John E. Kitching, National Institute of Standards and Technology (United States)

  • Michael S. Larsen, Northrop Grumman Navigation Systems (United States)

  • Uriel Levy, The Hebrew University of Jerusalem (Israel)

  • Frank A. Narducci, Naval Air Systems Command (United States)

  • Irina Novikova, The College of William & Mary (United States)

  • Gour S. Pati, Delaware State University (United States)

  • Stefania Residori, Institut Non Linéaire de Nice Sophia Antipolis (France)

  • Monika H. Schleier-Smith, Stanford University (United States)

  • David D. Smith, NASA Marshall Space Flight Center (United States)

  • Jennifer Strabley, Honeywell Technology (United States)

  • Misha Sumetsky, Aston University (United Kingdom)

  • Sharon M. Weiss, Vanderbilt University (United States)

  • Yanhong Xiao, Fudan University (China)

  • Avinoam Zadok, Bar-Ilan University (Israel)

Session Chairs

  • 1 Photonic Crystals

    Robert W. Boyd, University of Ottawa (Canada) and University of

    Rochester (United States)

    Avinoam Zadok, Bar-Ilan University (Israel)

  • 2 New Developments in Slow and Fast Light

    Luc Thévenaz, Ecole Polytechnique Fédérale de Lausanne (Switzerland)

  • 3 Steep Dispersion-based Sensing

    Zheng Wang, The University of Texas at Austin (United States)

  • 4 Optical Computing, Delay Lines, and Storage

    Yuval Yifat, The James Franck Institute (United States)

  • 5 Tutorial

    Jacob Scheuer, Tel Aviv University (Israel)

  • 6 Plasmonics

    Jacob B. Khurgin, Johns Hopkins University (United States)

  • 7 Nanophotonic Devices

    Avinoam Zadok, Bar-Ilan University (Israel)

  • 8 Nonlinear Effects for Steep Dispersion

    Misha Sumetsky, Aston University (United Kingdom)

  • 9 Fast Light, Non-Reciprocity, PT Symmetry, and Related Topics

    Aleksander K. Rebane, Montana State University (United States)

  • 10 Quantum Control Spin Squeezing and Related Technologies

    Liron Stern, The Hebrew University of Jerusalem (Israel)

  • 11 Atomic Clocks, Atomic Interferometers, and Enabling Technologies

    Onur Hosten, University of Illinois (United States)

  • 12 Integrated and Nanotechnology for Precision Metrology and Dispersion Engineering

    Scott Papp, National Institute of Standards and Technology (United States)

  • 13 Quantum Technologies for Precision Metrology and Sensing

    Andrey B. Matsko, OEwaves, Inc. (United States)

  • 14 New Developments in Precision Metrology

    Philip R. Hemmer, Texas A&M University (United States)

  • 15 Atom Interferometry

    Philippe Bouyer, Laboratory Photonique, Numérique et Nanosciences (France)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10548", Proc. SPIE 10548, Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI, 1054801 (5 July 2018);

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