Development of a real-time reflectance and transmittance monitoring system for the manufacturing of metaldielectric light absorbers

Bruno Badoil; Michel Cathelinaud; Fabien Lemarchand; Frédéric Lemarquis; Michel Lequime

doi:10.1117/12.2308179

21 November 2017 Development of a real-time reflectance and transmittance monitoring system for the manufacturing of metaldielectric light absorbers

Bruno Badoil, Michel Cathelinaud, Fabien Lemarchand, Frédéric Lemarquis, Michel Lequime

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Proceedings Volume 10567, International Conference on Space Optics — ICSO 2006; 105673S (2017) https://doi.org/10.1117/12.2308179
Event: International Conference on Space Optics 2006, 2006, Noordwijk, Netherlands

Abstract

Metal-dielectric light absorbers are of great interest for suppressing stray light in optical systems. Such coatings can give an absorption level greater than 99.9% over a broad spectral range provided that the complex refractive index of metallic films is accurately known. For this purpose we developed a new real-time monitoring system that allows to measure in situ both reflectance and transmittance of the coating during manufacturing in the deposition chamber. This paper describes the system design and its characteristics and gives some preliminary results concerning metallic thin film characterizations.

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Bruno Badoil, Michel Cathelinaud, Fabien Lemarchand, Frédéric Lemarquis, and Michel Lequime "Development of a real-time reflectance and transmittance monitoring system for the manufacturing of metaldielectric light absorbers", Proc. SPIE 10567, International Conference on Space Optics — ICSO 2006, 105673S (21 November 2017); https://doi.org/10.1117/12.2308179

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KEYWORDS

Reflectivity

Transmittance

Dielectrics

Manufacturing

Optical coatings

Refractive index

Opacity

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