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13 April 2018 Progress towards picometer accuracy laser metrology for the space interferometry mission: update
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Proceedings Volume 10568, International Conference on Space Optics — ICSO 2004; 105682L (2018) https://doi.org/10.1117/12.2500128
Event: International Conference on Space Optics 2004, 2004, Toulouse, France
Abstract
The Space Interferometry Mission, scheduled for launch in 2008, is an optical stellar interferometer with a 10 meter baseline capable of micro-arcsecond accuracy astrometry. A mission-enabling technology development program conducted at JPL, has yielded the heterodyne interferometric displacement metrology gauges required for monitoring the geometry of optical components of the stellar interferometer, and for maintaining stable starlight fringes. The gauges have <20 picometer linearity, <10 micron absolute accuracy, are stable to <200 pm over the typical SIM observation periods (~1 hour), have the ability to track the motion of mirrors over several meters. We discuss the technology that led to this level of performance: lowcross- talk, low thermal coefficient optics and electronics, active optical alignment, a dual wavelength laser source, and a continuously averaging, high data rate phase measurement technique. These technologies have wide applicability and are already being used outside of the SIM project, such as by the James Webb Space telescope (JWST) and Terrestrial Planet Finder (TPF) missions.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter G. Halverson, Oscar Alvarez-Salazar, Alireza Azizi, Frank Dekens, Bijan Nemati, and Feng Zhao "Progress towards picometer accuracy laser metrology for the space interferometry mission: update", Proc. SPIE 10568, International Conference on Space Optics — ICSO 2004, 105682L (13 April 2018); https://doi.org/10.1117/12.2500128
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