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13 April 2018 MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications
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Proceedings Volume 10568, International Conference on Space Optics — ICSO 2004; 105682O (2018) https://doi.org/10.1117/12.2500125
Event: International Conference on Space Optics 2004, 2004, Toulouse, France
Abstract
The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with subnanometer accuracy. The sensor uses a single laser in conjunction with fast phase modulators and low frequency detectors. We describe the design of the system - the principle of operation, the metrology source, beam-launching optics, and signal processing - and show results for target distances up to 1 meter. We then demonstrate how the system can be scaled to kilometer-scale distances and used for space-based applications.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert D. Peters, Oliver P. Lay, Serge Dubovitsky, Johan P. Burger, and Muthu Jeganathan "MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications", Proc. SPIE 10568, International Conference on Space Optics — ICSO 2004, 105682O (13 April 2018); https://doi.org/10.1117/12.2500125
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