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10 April 2018 Real-time in-chip phase noise characterization of digitally controlled swept laser source
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Distributed optical fiber sensors are increasingly utilized method of distributed strain and temperature sensing, and the swept laser source plays an significant role in these applications. However, there is dynamic frequency-noise as the laser sweeping. In this paper, we proposed and experimentally demonstrated a real-time in-situ phase noise detecting method in a field programmable gate array (FPGA) chip, which permits accurate and insightful investigation of laser stability. This method takes only 1 clock cycle to capture the phase noise.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zheyi Yao, Zhen Chen, Gerald Hefferman, and Tao Wei "Real-time in-chip phase noise characterization of digitally controlled swept laser source", Proc. SPIE 10598, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2018, 105982M (10 April 2018);


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