Paper
10 April 2018 Fabric defect detection based on visual saliency using deep feature and low-rank recovery
Author Affiliations +
Proceedings Volume 10615, Ninth International Conference on Graphic and Image Processing (ICGIP 2017); 1061507 (2018) https://doi.org/10.1117/12.2303816
Event: Ninth International Conference on Graphic and Image Processing, 2017, Qingdao, China
Abstract
Fabric defect detection plays an important role in improving the quality of fabric product. In this paper, a novel fabric defect detection method based on visual saliency using deep feature and low-rank recovery was proposed. First, unsupervised training is carried out by the initial network parameters based on MNIST large datasets. The supervised fine-tuning of fabric image library based on Convolutional Neural Networks (CNNs) is implemented, and then more accurate deep neural network model is generated. Second, the fabric images are uniformly divided into the image block with the same size, then we extract their multi-layer deep features using the trained deep network. Thereafter, all the extracted features are concentrated into a feature matrix. Third, low-rank matrix recovery is adopted to divide the feature matrix into the low-rank matrix which indicates the background and the sparse matrix which indicates the salient defect. In the end, the iterative optimal threshold segmentation algorithm is utilized to segment the saliency maps generated by the sparse matrix to locate the fabric defect area. Experimental results demonstrate that the feature extracted by CNN is more suitable for characterizing the fabric texture than the traditional LBP, HOG and other hand-crafted features extraction method, and the proposed method can accurately detect the defect regions of various fabric defects, even for the image with complex texture.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhoufeng Liu, Baorui Wang, Chunlei Li, Bicao Li, and Yan Dong "Fabric defect detection based on visual saliency using deep feature and low-rank recovery", Proc. SPIE 10615, Ninth International Conference on Graphic and Image Processing (ICGIP 2017), 1061507 (10 April 2018); https://doi.org/10.1117/12.2303816
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KEYWORDS
Defect detection

Convolution

Feature extraction

Visualization

Neural networks

Image segmentation

Detection and tracking algorithms

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